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1 Departamento de Geología, Universidad de Salamanca, 37008 Salamanca, Spain, 2 Departamento de Cristalografía y Mineralogía, Universidad Complutense de Madrid, 28040 Madrid, Spain, 3 European Synchrotron Radiation Facility, BP 220 38043 Grenoble Cedex, France, and 4 Institut Néel, Grenoble BP 166, F-38042 Grenoble Cedex 09, France
* E-mail: msuarez{at}usal.es
(Received 11 October 2006; revised 9 March 2007)
High-resolution synchrotron X-ray diffraction recorded on a collection of palygorskites with different chemical compositions (obtained by analytical electron microscopy) permits unambiguous correlation of the crystallographic parameters a (or a sin ß if a monoclinic phase is considered) with the nature of the octahedral sheet, i.e. with both the number of octahedral positions that are occupied and the type of octahedral cation. No significant changes in the lattice parameters b and c are observed. The unit cell modification consists essentially of an expansion in a as the number of cations with larger ionic radii (Mg2+ and Fe3+) predominates over smaller cations (Al3+). A linear dependency of a (or a sin ß) on the chemical composition of the octahedral sheet was obtained that can be used for classifying palygorskite into compositional groups, using only conventional diffraction data, without the need for chemical analyses.
KEYWORDS: palygorskite, synchrotron, X-ray diffraction, transmission electron microscopy
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