|
|
|
|||||||||||||||||
| JOURNAL HOME | HELP | CONTACT PUBLISHER | SUBSCRIBE | ARCHIVE | SEARCH | TABLE OF CONTENTS |
Research Paper |
UCHA1
APLOVI
OVÁ31 Department of Geology of Mineral Deposits, Comenius University, Mlynská dolina, 84215 Bratislava, Slovakia, 2 Science du Sol, Institut National de la Recherche Agronomique, Route de Saint-Cyr, 78026 Versailles, France, and 3 CLEOM, Comenius University, Mlynská dolina, 84215 Bratislava, Slovakia
* E-mail: uhlik{at}fns.uniba.sk
(Received 4 June 1999; revised 9 May 2000)
The results of a new technique for the measurement of the thickness distribution of fundamental particles are reported. The technique is based on high-resolution transmission electron microscopy (HRTEM) of Na-saturated mixed-layer illite-smectite dispersed in polyvinylpyrrolidone (PVP-10). Intercalation of PVP-10 increases the spacing of expandable interlayers and changes the arrangement of particles so that the number of layers per fundamental particle can be counted easily on HRTEM images. The data obtained by HRTEM on PVP-10-intercalated illite-smectite of hydrothermal origin are compared with data from the Pt-shadowing technique. A good agreement between the two methods for the measured thickness distributions, mean thickness and expandability confirms the reliability of the new technique. The same technique is applied to a set of four sedimentary samples with different expandabilities (8318%). The thickness of illite particles from shales and claystones has a lognormal distribution. Detrital and discrete illite particles can be distinguished from the thickness distribution of authigenic illite.
KEYWORDS: HRTEM, polyvinylpyrrolidone, mixed-layer clays, illite, smectite
This article has been cited by other articles:
![]() |
L. Aldega and D.D. Eberl Detrital illite crystals identified from crystallite thickness measurements in siliciclastic sediments American Mineralogist, October 1, 2005; 90(10): 1587 - 1596. [Abstract] [Full Text] [PDF] |
||||
![]() |
M. Honty, M. Honty, P. Uhlik, V. Sucha, M. Caplovicova, J. Francu, N. Clauer, and A. Biron SMECTITE-TO-ILLITE ALTERATION IN SALT-BEARING BENTONITES (THE EAST SLOVAK BASIN) Clays and Clay Minerals, October 1, 2004; 52(5): 533 - 551. [Abstract] [Full Text] [PDF] |
||||
![]() |
A. E. Blum, A. E. Blum, and D. D. Eberl MEASUREMENT OF CLAY SURFACE AREAS BY POLYVINYLPYRROLIDONE (PVP) SORPTION AND ITS USE FOR QUANTIFYING ILLITE AND SMECTITE ABUNDANCE Clays and Clay Minerals, October 1, 2004; 52(5): 589 - 602. [Abstract] [Full Text] [PDF] |
||||
![]() |
V. A. Drits and V. A. DRITS Structural and chemical heterogeneity of layer silicates and clay minerals Clay Minerals, December 1, 2003; 38(4): 403 - 432. [Abstract] [Full Text] [PDF] |
||||
![]() |
T. Dudek, T. Dudek, and J. Srodon THICKNESS DISTRIBUTION OF ILLITE CRYSTALS IN SHALES. II: ORIGIN OF THE DISTRIBUTION AND THE MECHANISM OF SMECTITE ILLITIZATION IN SHALES Clays and Clay Minerals, October 1, 2003; 51(5): 529 - 542. [Abstract] [Full Text] [PDF] |
||||
![]() |
C. Shang, C. Shang, J. A. Rice, D. D. Eberl, and J.-S. Lin MEASUREMENT OF ILLITE PARTICLE THICKNESS USING A DIRECT FOURIER TRANSFORM OF SMALL-ANGLE X-RAY SCATTERING DATA Clays and Clay Minerals, June 1, 2003; 51(3): 293 - 300. [Abstract] [Full Text] [PDF] |
||||
![]() |
T. Dudek, T. Dudek, J. Srodon, D. D. Eberl, F. Elsass, and P. Uhlik THICKNESS DISTRIBUTION OF ILLITE CRYSTALS IN SHALES. I: X-RAY DIFFRACTION VS. HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY MEASUREMENTS Clays and Clay Minerals, October 1, 2002; 50(5): 562 - 577. [Abstract] [Full Text] [PDF] |
||||
![]() |
J. Srodon Quantitative mineralogy of sedimentary rocks with emphasis on clays and with applications to K-Ar dating Mineralogical Magazine, October 1, 2002; 66(5): 677 - 687. [Abstract] [Full Text] [PDF] |
||||
| JOURNAL HOME | HELP | CONTACT PUBLISHER | SUBSCRIBE | ARCHIVE | SEARCH | TABLE OF CONTENTS |